IIT BHU Syllabus  Advanced Techniques for Materials Characterization

 

 

Advanced Techniques for Materials Characterization

X-ray diffraction.  Diffraction under non-ideal conditions.  Atomic scattering and Geometrical structure factors.

Factors influencing the intensities of diffracted beams. Powder X-ray diffractometer.  Applications of XRD in

ceramic materials.

Study of the morphology, aggregation, size and microstructure of ceramic materials using. Optical microscope,

quantitative phase analysis.

Principle of electron microscopy. Construction and operation of Transmission Electron Microscope and Scanning

Electron Microscope. Electron diffraction by crystalline solids; selected area diffraction. Atomic Force Microscope.

Mechanism of image formation in SEM and its processing. Electron microprobe analysis (EDAX and WDS).

Preparation of ceramic samples for electron microscopic studies. ESCA and PES.

Spectrophotometric analysis of ceramic materials: Basic laws of spectrophotometry and its application  in micro

analysis in UV/ Visible range, effect of reflectance factor on optical analysis, construction and working principle of

spectrophotometer, importance of additive absorbances in multiple analysis of materials.

Infrared spectrophotometry : General aspects of IR spectroscopy and its application in structural analysis of ceramic

systems, sources of IR radiations, Optical systems and operation of FTIR spectrophotometers. Samples preparation,

IR analysis and structural  co-relations.

Fluorescence and Phosphorescence spectroscopy: Basic principle, geometrical optics, construction, working

principle and use of fluorescence spectrometers in materials analysis. XRF and on-line analysis of ceramic materials.

Electron Spin Resonance spectroscopy in ceramic  systems. DTA, TGA and DSC with suitable examples of glass

and ceramic materials.